Suzhou Electric Appliance Research Institute
期刊號(hào): CN32-1800/TM| ISSN1007-3175

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基于多種檢測(cè)技術(shù)的開(kāi)關(guān)柜故障診斷實(shí)例分析

來(lái)源:電工電氣發(fā)布時(shí)間:2016-04-06 11:06 瀏覽次數(shù):10

基于多種檢測(cè)技術(shù)的開(kāi)關(guān)柜故障診斷實(shí)例分析 

林堅(jiān)1,潘益?zhèn)?,牛陳靈2,陳宜斌1 
(1 溫州供電公司,浙江 溫州 325000;
2 溫州電力建設(shè)有限公司,浙江 溫州 325000)
 
 

摘 要: 超聲波和暫態(tài)對(duì)地電壓TEV 檢測(cè)技術(shù)是開(kāi)關(guān)柜局部放電檢測(cè)的兩種常用手段。在故障診斷時(shí)應(yīng)用了這兩種檢測(cè)手段基礎(chǔ)上還引入了紫外成像檢測(cè)技術(shù),并對(duì)這三種檢測(cè)方法進(jìn)行分析比較。通過(guò)實(shí)際案例分析表明,紫外成像檢測(cè)技術(shù)在開(kāi)關(guān)柜故障診斷可以提供有價(jià)值的參考數(shù)據(jù),是其他兩種檢測(cè)技術(shù)的有效補(bǔ)充。
關(guān)鍵詞: 開(kāi)關(guān)柜;超聲波;暫態(tài)對(duì)地電壓;紫外成像檢測(cè)技術(shù)
中圖分類(lèi)號(hào):TM591 文獻(xiàn)標(biāo)識(shí)碼:B 文章編號(hào):1007-3175(2014)07-0051-04


Actual Example Analysis of Switch Cabinet Fault Diagnosis Based on Various Test Technology 

LIN Jian1, PAN Yi-wei1, NIU Chen-ling2, CHEN Yi-bin1 
(1 Wenzhou Power Supply Company, Wenzhou 325000, China;
2 Wenzhou Electric Power Construction Company, Wenzhou 325000, China)
 
 

Abstract: Ultrasonic and transient earth voltage (TEV) test technologies were two common methods to test partial discharge of switch cabinet. In fault diagnosis, these two methods were applied and on this basis, ultraviolet imaging test technology was also introduced. This paper analyzed and compared these three test methods. The actual examples show that the ultraviolet imaging technology can provide valuable reference data for switch cabinet fault diagnosis, to be an effective supplement for the other two test technologies.
        Key words: switch cabinet; ultrasonic; transient earth voltage; ultraviolet imaging test technology


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